ATMPI provides high throughput probing of die on wafers before and after saw. 

ATMI's wafer mapping and sorting services leverage our:

Handlers, Probers, and Testers - State of the art test equipment located in our San Jose, CA and LISP 1, Cabuyao City, Philippines facilities.
High-PAS Testing After Saw - Proprietary technology for highly parallel probing of wafers after saw at multiple temperatures (-55 to 200 °C).
Unique Specialty Testing - High throughput specialty testing including UIL/UIS (avalanche), RG/CG, QG, and DC testing through our QM1000™ tester.
Test Data in Real Time - Test data are uploaded in real time to the cloud to enable our customers to monitor their test data in real time through our DataCruncher™ tool.
WIP Tracking - State of the art online tracking of work orders through the WIP tool.