ATMPI has developed test solutions that allow highly parallel specialty testing (including UIL/UIS, RG/CG, QG, and DC) of wafers and packaged die on single insertions. The QM1000™ quad-site tester offers up to a 4X increase in throughput.

Low cost, high throughput testing service and projects from USEA

Ideal for specialty testing of:

• MOSFETs
• SiC-Type (Silicon Carbide) Semiconductors
• GaN-Type (Gallium Nitride) Semiconductors
• JFETs
• FETs
• IGBTs
• BJTs
• Diodes
• Mixed Signal ICs
• Discrete Analog Devices