The ATMPI provides turnkey solutions for semiconductor devices and components from wafer sort through assembly, parametric testing, and final functional testing Hot, Cold, and Ambient. Customer view their work in progress (WIP) on our cloud-based WIP. Our turnkey solutions allow a seamless scale-up option from a few parts to millions of parts per month.
Advanced Statistical Analysis – The DataCruncher™ can process large amounts of data to analyze correlation, statistical significance of process change, and failure analysis.
Failure Analysis Capabilities – We go beyond traditional Failure Analysis methods, offering a comprehensive suite of advanced tools and expert engineering to discover the root causes of complex failures. Our technology allows us to examine deep into the details of products failures.
Here’s how our Failure Analysis capabilities set us apart:
Radiographic X-Ray Inspection
Scanning Acoustic Microscopy (SAM)
Advanced Grinding & Polishing Techniques
Curve Tracer Analysis
High-Power & Low-Power Microscopy
Chemical Preparation & Decapsulation
Liquid Crystal Hot Spot Detection
Die Test Jig Analysis
Solder Pot Testing
Environmental Stress Testing
Moisture Sensitivity & Reflow Testing
Comprehensive Reliability Testing
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