ATMPI understands the importance of good die attach in devices including power MOSFETs; therefore ATMI develops Delta VSD (DVSD) testing for the engineering and production phases in accordance with MIL-STD-750D method 3161.

ATMPI provides the necessary inputs into the test development including:
Thermal characterization of the part with regard to VSD vs. Temperature.
Test development for the initial and final VSD determination.
Test development of the appropriate heating current pulse.
Test development of the duration of the heating pulse to ensure that the test interrogates the die to lead frame attachment.
ATMPI is unique in that we can scale engineering Delta VSD (DVSD) and perform true quadsite testing in production.